Recent advances have enabled the improvement of images generated by transmission electron microscopes. JEOL USA’s new JEM-1400Plus 120-kV TEM features high-resolution/high-contrast imaging, outstanding S/TEM analytical performance, elemental mapping with the latest large-area SDD detectors, cryomicroscopy, 3D tomography and montaging. High-contrast resolution is assured at 0.38 nm point-to-point and 0.2 nm lattice images. The device is well-suited to biological, polymer and materials research. JEOL USA Inc.
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