Ultrafast electron microscopy enables scientists to explore ultrafast events and processes that occur at the atomic and molecular spatial scale of over time spans measured in femtoseconds. FEI Company’s Tecnai Femto UEM is a commercial application of the UEM technology pioneered by Prof. Ahmed Zewail at the California Institute of Technology, and enables the observation of processes such as photoactuation and the crystallization or recrystallization of materials. The device combines femotsecond time resolution with nanometer spatial resolution, allowing researchers to see the structural changes that occur at the atomic scale in response to the energetic stimuli. FEI Company
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