The capacity of Zeiss scanning electron microscopes (SEM) and focused ion beam SEMs (FIB-SEM) can now be extended with the new Zeiss Atlas 5 hardware and software package. The package streamlines automatic image acquisition and lets users benefit from efficient navigation and correlation of images from any source including light and X-ray microscopes.
Taking full advantage of high-throughput and automated large area imaging, users acquire large sets of 2D or 3D nanoscale electron microscope (EM) images for hours, or even days, without operator supervision. Advanced preset and customizable protocols allow it to produce consistent and reproducible results.
The system’s correlative workspace makes it easy to bring together images from multiple sources: zooming in from the full macroscopic view of the sample down to nanoscale details. The sample-centric workspace lets users build a seamless multi-modal, multi-scale picture of the sample.
A novel graphical user interface makes it easy to investigate all samples. Users design a workflow tailored precisely to the complexity of their experiments, no matter whether it’s a simple one-step task or a compound experiment. A sophisticated workflow environment guides the user all the way from the setup for automated acquisition to post-processing and customized exports, and right on through to analysis. Zeiss
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