Users of AFM-based IR spectroscopy platforms have indicated they need simplified sample preparation and the ability to measure samples in-situ. After considering these needs, Anasys engineered these abilities into its NanoIR2 spectrometer. The device can operate with top-side illumination, eliminating the prior need to prepare samples on a ZnSe prism and enabling measurements on a much more diverse set of samples, including semiconductor devices, thin films, nanocomposites, data storage samples, minerals, tissue sections and polymer blends. A new resonance-enhanced mode also increases the sensitivity of the technique and enables AFM-IR measurements on samples of less than 20 nm in thickness. Anasys Instruments Corporation
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