Application-specific TEM systems improve efficiency

Using transmission electron microscopy systems that are tailored for your industry or application can help improve efficiency. The FEI Company’s Metrios TEM system provides the fast, precise measurements needed by semiconductor manufacturers to develop and control their wafer fabrication process. With enhanced automation and ease-of-use, the completely digital Talos TEM system combines high-resolution, high-throughput TEM imaging with fast, precise and quantitative energy dispersive X-ray analysis to deliver advanced analytical performance. And the Titan Themis TEM system enables direct measurements of properties, such as magnetic fields, on the nanometer-length scale, and electric fields even down to the atomic scale. FEI Company