The bench-top JSM-6000PLUS NeoScope is designed to make it possible to bring the basic high-resolution imaging and analysis features of a full-sized scanning electron microscope into the lab. It fits into both small spaces and economical budgets, while simple operation and versatile functions complement the workflow with optical microscopes or larger SEMs.
The third generation of the NeoScope bench-top SEM, this model combines convenience and ease of use while providing fast, high magnification electron microscopy. It offers high sensitivity backscatter electron detection with a BSE detector manufactured by JEOL to detect contrast between areas of the sample with different chemical compositions. System is suitable for rapid inspection of electronics, pharmaceuticals, forensic evidence, and a wide variety of materials and organic samples. JEOL
Print this page