The ZEISS LSM 800 confocal laser scanning microscope enables precise, three-dimensional imaging of microstructures and surfaces for materials applications and analysis in research and industry. The combination of confocal fluorescence and other contrasting techniques in one instrument enables high-precision examination of nanomaterials, metals, polymers, and semiconductors with maximum information content. The system offers precise capture of 3D topography and the investigation of nanometer-scaled structures without causing surface damage.
The combination of the microscope’s laser scanning module with the Axio Imager inverted microscope platform, enables a wide variety of configurations in hardware, for example objectives, stages and illumination. Users save time on set-up and sample handling due to the availability of various optical techniques such as brightfield, darkfield, polarization and circular differential interference contrast (C-DIC).
The microscope also comes with the newest version of ZEN imaging software, which includes an open application development interface for data exchange with established third-party analysis and research software. The microscope offers high reproducibility of measurements and provides a guided acquisition workflow to make operation easier and enable standardized acquisition parameters. Carl Zeiss Microscopy
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