The NEX DE VS direct excitation variable spot X-ray fluorescence (EDXRF) elemental analyzer is equipped with a 60 kV, 12 W X-ray tube and a high-throughput Si drift detector. The detector supports count rates in excess of 500K cps, resulting in low limits of detection. The instruments were designed for demanding applications or for situations where analysis time or sample throughput is critical, and is suitable for applications including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications.
The analyzer is suited for small spot analysis applications. It features a high resolution camera combined with automated collimators allowing for precise positioning of a sample for the analysis of 1 mm, 3 mm, and 10 mm spot sizes. These features, combined with the advanced Rigaku QuantEZ analytical software, provide high performance for both bulk and small spot analysis in a single instrument. Rigaku
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