New family of electron microscopes combines ultra-high resolution and analytical performance for a wide range of materials. The ultra-high resolution scanning electron microscopes (UHR SEMs) is designed to provide nanometer-scale resolution and ultra-precise analysis on a very wide range of samples. Initial shipments are planned for the fourth quarter of this year. In low vacuum, the instrument can examine highly insulating samples, up to nearly the same resolution that can be achieved in high vacuum, with little or no preparation, eliminating artifacts and saving time.
FEI
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