Resolution improvements of scanning electron microscopes mean images are clearer than ever before. JEOL’s JSM-IT300LV SEM has a magnification range of 5X to 300,000X, and a vacuum pressure range of 10 to 650 pA.In low-vacuum mode, this capability enhances imaging for samples that are wet, oily outgas excessively or are non-conductive without pretreatment. The large chamber accommodates samples up to 300 mm in diameter and 80 mm in height. Sample navigation control, an embedded CCD camera and five-axis stage control with asynchronous movement, make it possible to image and analyze samples at a wide range of angles and orientations. JEOL USA
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