The NanoWizard’s 4 NanoScience atomic force microscope (AFM) features a powerful fast scanning option that delivers images every three seconds, enabling users to track dynamic processes. Additionally quantitative imaging is possible with outstanding high resolution. The systems provides specific solutions for mechanical and electrical sample characterization and delivers flexible, advanced research capabilities that address the increasingly complex challenges faced by materials scientists. The system employs a powerful digital controller to enable atomic resolution and fast scanning capabilities on a single platform. A special mode based on real force curves gives the user a high degree of force sensitivity and control to be able to handle any brittle, delicate, soft or sticky sample. The system’s scanner technology delivers three seconds per image performance for a 100 x 100 micron image area, performance the manufacturer says is thirty times faster than other AFMs with such a large scan range. JPK Instruments
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