Some materials are difficult to image without coatings and preparation. Two new imaging systems from FEI make it easier to image challenging materials. The Scios Dualbeam is for fast 2D and 3D characterization of both magnetic and non-magnetic samples. Its high-current capability provides fast x-ray analysis and improves FIB milling accuracy on non-conductive samples by neutralizing accumulated charge. The Helios Nanolab 660 Dualbeam is suitable for fabricating nanodevice prototypes. It includes three in-lens detectors that users manipulate to selectively enhance material contrast topographic contrast, edge detection, surface specificity and much more. FEI Company
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