Atom probe microscope provides three-dimensional nano-scale surface, bulk and interfacial materials analysis with atom-by-atom identification and accurate spatial positioning. The LEAP 5000 instrument integrates mature technologies from previous LEAP models and comes equipped with a redesigned detection system offering increased efficiency, advanced laser control, faster data collection and real-time monitoring capabilities, all housed in a more robust and ergonomic platform. Combines analytical accuracy, sensitivity and 3D spatial resolution for researchers working in metals, semiconductors and insulators. CAMECA
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