The Nanopix SAXS/WAXS X-ray scattering measurement system is designed for nanostructure analyses. The system can be used for both small angle scattering (SAXS) and wide angle scattering (WAXS) measurements, which makes it possible to evaluate multiscale structures from sub-nanometer to nano-order (0.1 nm to 100 nm). The manufacturer says the system achieves a very high level of small angle resolution (Qmin to 0.02 nm-1) for a laboratory SAXS instrument.
Small angle X-ray scattering (SAXS) is a technique used to study nanoscale structures of atoms or molecules and their variation by measuring the diffuse scattering from unequal electron density areas. SAXS experiments are performed in a wide range of fields from R&D to quality control.
The system is applicable to the study of a variety of materials including solids, liquids, liquid-crystals, or gels with ordered and disordered structures, and diverse applications including nanoparticle size distribution analyses, three-dimensional protein molecule structure analyses, identification of molecular assembly or disassembly and research of advanced materials, such as carbon fibre-reinforced plastics (CFRP).
The system is configured with a high-brilliance, high-power point focus X-ray source, the OptiSAXS high-performance multilayer mirror, the ClearPinhole high-performance, low scattering pinhole slits, and the HyPix-3000 high-performance 2D semiconductor detector that enables the detection of diffraction and scattering even from anisotropic materials. Rigaku
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