Solutions provide faster time-to-analysis in metals research

Successful characterization of metals and magnetic materials requires high-resolution, high-contrast images and fast, precise analytical results. Two new products speed up the imaging and analysis time for metals researchers and industrial failure analysis labs. The Helios PFIB DualBeam – which includes a plasma-based focused ion beam (FIBs) – mills 20 to 50 times faster than gallium-based FIBs and delivers rapid, 3D imaging and analysis. The Teneo scanning electron microscope (SEM) provides high-resolution, high-contrast images and fast, precise analytical results, enabling researchers to resolve grain boundaries, interfaces and structure/topography of difficult-to-image magnetic and nonconductive samples. FEI