Improving materials characterization with scanning electron microscopes requires selecting analytical tools with the required sensitivity and specificity. Bruker’s Xsense parallel beam wavelength dispersive x-ray spectrometer for elemental analysis is designed for the lower energy range between 100 and 3,600 eV. It provides energy resolution down to 4 eV, enabling separation of closely spaced x-ray lines and highly sensitive trace element detection. Xtrace is a new enables photon-induced micro-XRF spectrometery on SEM systems. It provides the capability of detecting and analyzing trace amounts of higher-Z elements in the sample, and can be tuned for almost any application. Bruker Corporation
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