The boundaries for performance of analytical instrumentation are continually being pushed to the limits. JPK Instruments has launched a new AFM system capable of delivering fast scanning and super-resolution on a single instrument platform, the NanoWizard Ultra Speed AFM. The fast scanning device enables users to track sample changes in real-time whether the sample is imaged in air or liquid. Scanning at speeds of greater than 100 Hz line rate with excellent, true atomic resolution in closed-loop mode is enabled by the enhanced low noise of scanner, position sensor and detection system. It may be fully integrated with an inverted optical microscope. JPK Instruments
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