Many applications, such as cement production, mineral beneficiation or polymer production, require cost-effective and flexible analytical tools. Panalytical’s upgraded Epsilon 3X benchtop X-ray fluorescence spectrometers are equipped with 50 kV excitation and the latest high-resolution silicon drift detector enabling analysis of elements fro sodium up to americium. The Epsilon 3XLE is configured with the even more powerful SDDULTRA silicon drift detector that makes analysis of ultra-light elements possible. Elements can be present in concentrations ranging from ppm to 100 per cent with little or no sample preparation required. Software for standardless analysis, fingerprinting, regulatory compliance or multi-layer analysis is available. Panalytical
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